CEI EN 60749:2000-10
Withdrawn
Withdrawn
Semiconductor Devices Methods for Climatic and Mechanical Testing
Amended by
Published date
10-01-2000
Publisher
Withdrawn date
03-01-2006
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This Standard lists a number of test methods applicable to semiconductor devices (discrete devices and integrated circuits) within which a choice can be made.
| Committee |
CT 309
|
| DocumentType |
Standard
|
| ProductNote |
New child AMD 1 2001 is now added New child AMD 2 2004 is now added
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Withdrawn
|
| Standards | Relationship |
| EN 60749:1999 | Identical |
| IEC 60749:1996 | Identical |
Summarise
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