CEI EN 60749/A1:2001-11
Withdrawn
Withdrawn
Semiconductor Devices Climatic and Mechanical Test Methods
Amendment of
Published date
11-01-2001
Publisher
Withdrawn date
03-01-2006
Sorry this product is not available in your region.
This European Variant is published in English only due to its limited use, particularly aimed at specialized fields.
| Committee |
CT 309
|
| DocumentType |
Amendment
|
| ProductNote |
This standard is also Identical to IEC 60749/A1:2000
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Withdrawn
|
Summarise
Sorry this product is not available in your region.