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CEI EN 60749/A1:2001-11

Withdrawn

Withdrawn

Semiconductor Devices Climatic and Mechanical Test Methods

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-01-2001

Withdrawn date

03-01-2006

This European Variant is published in English only due to its limited use, particularly aimed at specialized fields.

Committee
CT 309
DocumentType
Amendment
Pages
16
ProductNote
This standard is also Identical to IEC 60749/A1:2000
PublisherName
Comitato Elettrotecnico Italiano
Status
Withdrawn