UNE 20699:1992
Superseded
Superseded
SEMICONDUCTOR DEVICES. MECHANICAL AND CLIMATIC TEST METHODS.
Published date
10-15-1992
Publisher
Superseded date
11-15-2000
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| Committee |
CTN 209
|
| DocumentType |
Standard
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Identical |
| IEC 60749:1984 | Identical |
Summarise
Sorry this product is not available in your region.