ASTM E 1127 : 1991 : R1997
Superseded
View Superseded by
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
English
09-10-1997
11-11-2014
| Committee |
E 42
|
| DocumentType |
Guide
|
| Pages |
5
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.
1.2 Guidelines are given for depth profiling by the following:
Section Ion Sputtering 6 Angle Lapping and Cross-Sectioning 7 Mechanical Cratering 8 Nondestructive Depth Profiling 91.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
| ASTM E 2735 : 2014 | Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments |
| ASTM E 996 : 2019 | Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy |
| ASTM E 1078 : 2014 | Standard Guide for Specimen Preparation and Mounting in Surface Analysis |
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