ASTM F 1893 : 1998 : R2003
Superseded
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
English
07-01-1998
08-12-2020
| Committee |
F 01
|
| DocumentType |
Guide
|
| Pages |
5
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| Supersedes |
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
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