ASTM F 1996 : 2000
Superseded
View Superseded by
Standard Test Method for Silver Migration for Membrane Switch Circuitry
English
06-10-2001
11-11-2014
| Committee |
F 01
|
| DocumentType |
Test Method
|
| Pages |
2
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
1.1 This test method is used to determine the susceptibility of a membrane switch to the migration of the silver between circuit traces under dc voltage potential.
1.2 Silver migration will occur when special conditions of moisture and electrical energy are present.
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.