ASTM F 219 : 1996 : R2013
Superseded
View Superseded by
Standard Test Methods of Testing Fine Round and Flat Wire for Electron Devices and Lamps
English
05-01-2013
12-03-2023
CONTAINED IN VOL. 10.04, 2018 Defines the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps.
| Committee |
F 01
|
| DocumentType |
Test Method
|
| Pages |
3
|
| ProductNote |
Reconfirmed 2013
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
1.1These test methods cover the testing of fine wire, flat or round, approximately 0.010 in. (0.25 mm) and smaller in diameter or thickness, used in electronic devices and lamps.
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| ASTM D 374 : 1999 | Standard Test Methods for Thickness of Solid Electrical Insulation |
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