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ASTM F 40 : 1983

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)

Withdrawn date

12-31-1989

Published date

12-31-2010

Describes Czochralski technique for growing single crystals of silicon for semiconductor applications under controlled standardized conditions. Evaluates crystals by measurements of physical, electrical and other parameters.

DocumentType
Test Method
PublisherName
American Society for Testing and Materials
Status
Withdrawn

ASTM D 1125 : 2014 : REDLINE Standard Test Methods for Electrical Conductivity and Resistivity of Water (Withdrawn 2023)
ASTM F 43 : 1999 Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
ASTM F 47 : 1994 Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998)

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