ASTM F 40 : 1983
Withdrawn
Withdrawn
Method for Preparing Monocrystalline Test Ingots of Silicon by the Vertical-Pulling (Czochralski) Technique (Withdrawn 1988)
Published date
12-31-2010
Withdrawn date
12-31-1989
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Describes Czochralski technique for growing single crystals of silicon for semiconductor applications under controlled standardized conditions. Evaluates crystals by measurements of physical, electrical and other parameters.
| DocumentType |
Test Method
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
| ASTM D 1125 : 2014 : REDLINE | Standard Test Methods for Electrical Conductivity and Resistivity of Water (Withdrawn 2023) |
| ASTM F 43 : 1999 | Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003) |
| ASTM F 47 : 1994 | Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998) |
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