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ASTM F 570 : 1990

Withdrawn

Withdrawn

Test Method for Transistor Collector-Emitter Saturation Voltage (Withdrawn 1995)

Published date

01-12-2013

Withdrawn date

12-31-1995

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CONTAINED IN VOL 10.04 Covers tests to determine transistor collector emitter saturation voltage, under specified conditions.

DocumentType
Test Method
PublisherName
American Society for Testing and Materials
Status
Withdrawn

MIL-HDBK-817 Base Document:1994 System Development Radiation Hardness Assurance

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