ASTM F 632 : 1990
Withdrawn
Withdrawn
Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
Published date
12-31-2010
Withdrawn date
12-31-1995
Sorry this product is not available in your region.
CONTAINED IN VOL 10.04 1999 Covers measurement of transistors at high frequencies. Suitable for measurement at a single given value of small-signal collector current and for a given set of d-c bias conditions.
| DocumentType |
Test Method
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
| MIL-HDBK-817 Base Document:1994 | System Development Radiation Hardness Assurance |
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