• Shopping Cart
    There are no items in your cart

ASTM F 805 : 1983 : R1992 : EDT 1

Withdrawn

Withdrawn

Test Method for Photoplate Surface Flatness by Inteferometric Non-Contact Technique (Withdrawn 1996)

Available format(s)

PDF

Language(s)

English

Published date

12-31-2010

Withdrawn date

12-31-2010

US$83.00
Excluding Tax where applicable

CONTAINED IN VOL 10.05 1997 Describes use of grazing incidence interferometer for measuring maximum peak-to-valley deviation (TIR) of specimen surface. Limited to interferometers using monochromatic light source.

Committee
ASTM
DocumentType
Test Method
Pages
6
PublisherName
American Society for Testing and Materials
Status
Withdrawn

ASTM F 579 : 1980 : R1987 : EDT 1 Test Method for Face Flatness by Optical Non-Contact Technique (Withdrawn 1994)
ANSI Z136.1 : 2014 SAFE USE OF LASERS
ASTM F 775 : 1988 Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)

US$83.00
Excluding Tax where applicable