ASTM F 867M : 1994 : REV A
Superseded
Superseded
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Guide for Ionizing Radiation Effects (Total Dose) Testing of Semiconductor Devices [Metric] (Withdrawn 1998)
Published date
12-31-2010
Superseded date
02-18-2021
Superseded by
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| DocumentType |
Guide
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
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