ASTM UOP 972 : 2001
Withdrawn
Aluminum, Silicon and Silver in Acetic Acid by ICP-OES
English
07-29-2002
11-11-2014
Defines trace (mass-ppm) concentrations of aluminum, silicon and silver in acetic acid by Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES).
| DocumentType |
Standard
|
| Pages |
5
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Withdrawn
|
This method is for determining trace (mass-ppm) concentrations of aluminum, silicon and silver in acetic acid by Inductively Coupled Plasma-Optical Emission Spectrometry (ICP-OES). The lower limits of detection for aluminum, silicon, and silver are 0.1 mass-ppm, 1 mass-ppm, and 0.01 mass-ppm, respectively. The upper range of determination is approximately 100 mass-ppm. The method is also applicable, but has not been verified, for the determination of other metals.
| ASTM U 09 : 2013 | Precision Statements in UOP Methods |
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