BS CECC 90100:1983
Superseded
View Superseded by
Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits
Hardcopy
English
08-31-1983
07-23-2013
Provides general details, quality assessment procedures, test and measurement procedures and a common blank detail specification.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| BS CECC 90112:1987 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits |
| BS CECC 90103:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY circuits, series 54LS, 64LS, 74LS, 84LS |
| BS CECC 90101:1980 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits, series 54, 64, 74, 84 |
| BS EN 190103:1994 | Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL low power SCHOTTKY, circuits, series 54LS, 64LS, 74LS, 84LS |
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