BS CECC 90112:1987
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
Hardcopy , PDF
English
08-15-1987
05-22-2026
Gives ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS CECC 90100 in any detail specification for these devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 90/20593 DC (01/2006)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
Withdrawn:This standard is no longer used
| Standards | Relationship |
| CECC 90112 : 86 AMD 1 93 | Identical |
| BS CECC 90100:1983 | Harmonized system of quality assessment for electronic components: sectional specification: digital monolithic integrated circuits |
| BS CECC 90000:1991 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
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