BS E9007:1975
Withdrawn
Withdrawn
Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-31-1975
Publisher
Withdrawn date
11-04-2009
US$102.96
Excluding Tax where applicable
Interprets BS 6001 (and IEC 60410) clauses as applied to specifications in harmonized system of quality assessment for electronic components.
| Committee |
W/-
|
| DevelopmentNote |
Also numbered as CECC 00007:1973 (01/2006) Reviewed and confirmed by BSI, January 2008. (12/2007)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| UNE-EN 62258-1:2005 | Identical |
| BS EN 111000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: cathode ray tubes |
| BS EN 114000:1993 | Harmonized system of quality assessment for electronic components: generic specification: photomultiplier tubes |
| BS CECC 30301 024:1981 | Harmonized detail specification for fixed aluminium electrolytic capacitors (long-life grade). Non-solid electrolyte. Cylindrical, polar insulated metallic case, clamp or stud mounting screw terminations. Full plus additional assessment level |
| BS CECC 20000:1983 | Harmonized system of quality assessment for electronic components: generic specification: semiconductor optoelectronic and liquid crystal devices |
| BS CECC 90000:1985 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS EN 135000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: travelling wave amplifier tubes |
| BS EN 175300:1997 | Harmonized system of quality assessment for electronic components. Sectional specification:rectangular connectors for frequencies below 3 MHz |
| BS CECC 46000:1978 | Harmonized system of quality assessment for electronic components: generic specification: cold cathode indicator tubes |
| BS CECC 63000:1990 | Harmonized system of quality assessment for electronic components. Generic specification: film and hybrid integrated circuits |
| BS CECC 41000:1977 | Harmonized system of quality assessment for electronic components: generic specification for potentiometers |
| BS CECC 50000:1987 | Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices |
| BS EN 112000:1997 | Harmonized system of quality assessment for electronic components. Generic specification: image converter and image intensifier tubes |
| BS EN 136000:1993 | Harmonized system of quality assessment for electronic components: generic specification: magnetrons |
| EN 112000:1992 | Generic Specification: Image converter and image intensifier tubes |
| BS EN 125200:1993 | Harmonized system of quality assessment for electronic components: sectional specification: magnetic oxide cores for linear transformers |
| BS CECC 75100:1984 | Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application |
| BS CECC 42000:1978 | Harmonized system of quality assessment for electronic components: generic specification: varistors |
| BS EN 113000:1993 | Harmonized system of quality assessment for electronic components. Generic specification: camera tubes |
| BS EN 190000:1996 | Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits |
| BS CECC 45000:1977 | Specification for harmonized system of quality assessment for electronic components: generic specification: space-charge controlled tubes |
| EN 190000:1995 | Generic Specification: Monolithic integrated circuits |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
Summarise
US$102.96
Excluding Tax where applicable
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