BS E9376(1976) : 1976 AMD 7597
Superseded
Superseded
View Superseded by
SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. VARIABLE CAPACITANCE DIODE(S)
Published date
11-23-2012
Publisher
Superseded date
02-15-1993
Superseded by
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Gives ratings, characteristics and inspection requirements which shall be included as mandatory requirements in accordance with BS E9300 in any detail specification for these devices. BS AMD 7597 renumbers this standard to BS EN 150006
| Committee |
ECL/24
|
| DevelopmentNote |
Renumbered and superseded by BS EN 150006. (09/2005)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 50006 : 80 AMD 1 | Identical |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| CECC 50000 : 86 AMD 3 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES |
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