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CECC 50000 : 86 AMD 3

Withdrawn

Withdrawn

SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES

Published date

01-12-2013

Withdrawn date

06-02-2016

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Committee
SR 47E
DevelopmentNote
Also numbered as I.S. 543 (01/2002)
DocumentType
Standard
PublisherName
Cenelec Electronic Components Committee
Status
Withdrawn

BS E9376(1976) : 1976 AMD 7597 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION. VARIABLE CAPACITANCE DIODE(S)
BS CECC 50010(1983) : 1983 AMD 7591 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - AMBIENT RATED THYRISTORS
DEFSTAN 59-61(PT4)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 4: TRANSISTORS, NPN TYPE
DEFSTAN 59-61(PT7)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 7: OPTOELECTRONIC DEVICES
BS EN 150009:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: case-rated rectifier diodes
BS CECC 50013(1984) : 1984 AMD 7594 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS BLANK DETAIL SPEC - CURRENT REGULATOR & CURRENT REFERENCE DIODES
BS EN 150008:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: ambient-rated rectifier diodes
BS EN 150012:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors
BS CECC 50012(1978) : 1978 AMD 7593 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - SINGLE GATE FIELD EFFECT TRANSISTORS
BS CECC50008(1992) : 1992 AMD 7698 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: BLANK DETAIL SPECIFICATION: AMBIENT RATED RECTIFIER DIODES
BS CECC50009(1992) : 1992 AMD 7699 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPECIFICATION: CASE RATED RECTIFIER DIODES
BS CECC17000(1992) : 1992 AMD 9626 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION - SOLID STATE ALL OR NOTHING RELAYS - GENERIC DATA AND METHODS OF TEST
BS CECC50001(1981) : 1981 AMD 7590 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: GENERAL PURPOSE SEMICONDUCTOR DIODES
BS E9374(1976) : 1976 AMD 7596 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: BIPOLAR TRANSISTORS FOR SWITCHING APPLICATIONS
DEFSTAN 59-61(PT5)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 5: TRANSISTORS, PNP TYPE
DEFSTAN 59-61(PT1)/3(1981) : 1981 SEMICONDUCTOR DEVICES - PART 1: GENERAL REQUIREMENTS
DIN EN 150010:1997-02 BLANK DETAIL SPECIFICATION - AMBIENT-RATED THYRISTORS
BS EN 150015:1993 Harmonized system of quality assessment for electronic components. Blank detail specification: unidirectional transient overvoltage suppressor diodes
BS CECC 50011(1983) : 1983 AMD 7592 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - BLANK DETAIL SPEC - CASE RATED THYRISTORS
04/30114936 DC : DRAFT JUN 2004 EN 50439 - RAILWAY APPLICATIONS - RELIABILITY TESTS FOR HIGH POWER SEMICONDUCTORS DEVICES - PART 1: STANDARD BASE-PLATE MODULES
DEFSTAN 59-61(PT6)/1(1981) : 1981 SEMICONDUCTOR DEVICES - PART 6: FIELD EFFECT TRANSISTORS
BS E9377(1976) : 1976 AMD 7598 SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS. BLANK DETAIL SPECIFICATION: CASE RATED BIPOLAR TRANSISTORS FOR HIGH FREQUENCY AMPLIFICATION
DIN EN 150008:1993-10 BLANK DETAIL SPECIFICATION: AMBIENT-RATED RECTIFIER DIODES
DEFSTAN 59-61(PT3)/2(1981) : 1981 SEMICONDUCTOR DEVICES - PART 3: THYRISTORS
EN 150012 : 1991 Blank Detail Specification: Single gate field-effect transistors

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