BS EN 150012:1993
Withdrawn
Specification for harmonized system of quality assessment for electronic components. Blank detail specification: single gate field-effect transistors
Hardcopy , PDF
English
02-15-1978
04-25-2012
National foreword
Foreword
Section 1 - Low frequency amplification
Section 2 - High frequency amplification
Section 3 - Switching applications
Section 4 - Chopper applications
Section 5 - Voltage-controlled resistor (VCR)
applications
Section 6 - Low level d.c. amplifier applications
Ratings, characteristics and inspection requirements to be included in detail specifications for use in the CECC system of harmonized specifications. Applications include low frequency amplification, high frequency amplification, switching, chopper, voltage-controlled, low level d.c. amplification.
| Committee |
EPL/47
|
| DevelopmentNote |
Renumbers and supersedes BS CECC 50012(1978). 1993 Version incorporates amendment 7593 to BS CECC 50012(1978). (09/2005)
|
| DocumentType |
Standard
|
| Pages |
70
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| CECC 50012 : 80 AMD 1 | Identical |
| EN 150012 : 1991 | Identical |
| DIN EN 150012:1996-11 | Identical |
| IEC 60191-2:2012 DB | Mechanical standardization of semiconductor devices - Part 2: Dimensions |
| CECC 50000 : 86 AMD 3 | SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: GENERIC SPECIFICATION FOR DISCRETE SEMICONDUCTOR DEVICES |
| BS 3934:1965 | Specification for dimensions of semiconductor devices and integrated electronic circuits |
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