BS EN 60749-17:2003
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
Hardcopy , PDF
English
06-29-2004
05-15-2019
Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary
Performed to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203283 DC. Partially supersedes BS EN 60749 (07/2003)
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| Standards | Relationship |
| NBN EN 60749-17 : 2004 | Identical |
| DIN EN 60749-17:2003-09 | Identical |
| IEC 60749-17:2003 | Identical |
| EN 60749-17:2003 | Identical |
| I.S. EN 60749-17:2003 | Identical |
| NF EN 60749-17 : 2003 | Identical |
| UNE-EN 60749-17:2003 | Identical |
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