EN 60749-17:2003
Superseded
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Published date
04-17-2003
Superseded date
02-01-2022
Superseded by
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Foreword
1 Scope and object
2 Test apparatus
3 Procedure
4 Summary
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
| Committee |
CLC/SR 47
|
| DocumentType |
Standard
|
| PublisherName |
European Committee for Standards - Electrical
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 60749-17 : 2003 | Identical |
| IEC 60749-17:2003 | Identical |
| NBN EN 60749-17 : 2004 | Identical |
| NEN EN IEC 60749-17 : 2003 | Identical |
| I.S. EN 60749-17:2003 | Identical |
| PN EN 60749-17 : 2005 | Identical |
| BS EN 60749-17:2003 | Identical |
| CEI EN 60749-17 : 2004 | Identical |
| DIN EN 60749-17:2003-09 | Identical |
| BS EN 62341-5:2009 | Identical |
| UNE-EN 60749-17:2003 | Identical |
Summarise
Sorry this product is not available in your region.