CEI EN 60749-17 : 2004
Superseded
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
Hardcopy , PDF
English
01-01-2004
11-15-2019
FOREWORD
1 Scope
2 Terms and definitions
3 General remarks
4 Equipment
5 Test procedure
6 Failure criteria
7 Lot acceptance (for guidance)
8 Detail specification
9 Summary
Bibliography
Defines to determine the susceptibility of semiconductor devices to degradation in the neutron environment.
| Committee |
CT 309
|
| DevelopmentNote |
Classificazione CEI 47-31. (01/2005) Supersedes CEI EN 60749. (05/2008)
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC 60749-17:2003 | Identical |
| EN 60749-17:2003 | Identical |
A newer version of this standard is available.
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