NEN EN IEC 60749-17 : 2003
Withdrawn
Withdrawn
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 17: NEUTRON IRRADIATION
Published date
01-12-2013
Publisher
Withdrawn date
05-20-2019
Superseded by
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Defines the susceptibility of semiconductor devices to degradation in the neutron environment. Applies to integrated circuits and discrete semiconductor devices. Beneficial for military and space-related applications as it is a destructive test.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| IEC 60749-17:2003 | Identical |
| EN 60749-17:2003 | Identical |
Summarise
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