NEN-EN-IEC 60749-17:2019
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Published date
05-01-2019
Publisher
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The neutron irradiation test is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation.
| Committee |
TC 47
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN IEC 60749-17:2019 | Identical |
| IEC 60749-17:2019 | Identical |
Summarise
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