BS EN 60749-9:2002
Superseded
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
Hardcopy , PDF
English
09-24-2002
01-01-2017
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
10
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| IEC 60749-9:2002 | Identical |
| EN 60749-9:2002 | Equivalent |
| I.S. EN 60749-9:2002 | Equivalent |
| EN 60749-9:2017 | Identical |
| UNE-EN 60749-9:2003 | Identical |
| NF EN 60749-9 : 2002 | Identical |
| DIN EN 60749-9:2016-09 (Draft) | Identical |
| IEC 60749-9:2017 | Identical |
| I.S. EN 60749-9:2017 | Identical |
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