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BS EN 61967-8:2011

Superseded

Superseded

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Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

11-30-2011

Superseded date

06-15-2023

Superseded by

BS EN IEC 61967-8:2023

US$238.62
Excluding Tax where applicable
Summarise this standard

1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC Emissions reference levels
Annex A (normative) - IC stripline description
Annex B (informative) - Specification of emission
        levels
Bibliography
Annex ZA (normative) - Normative references to
         international publications with their
         corresponding European publications

Describes a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz.

Committee
EPL/47
DevelopmentNote
Supersedes 09/30191130 DC. (11/2011)
DocumentType
Standard
Pages
22
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

Standards Relationship
EN 61967-8:2011 Identical
EN 60286-3:2007 Identical
IEC 61967-8:2011 Identical
I.S. EN 61967-8:2011 Equivalent
UNE-EN 61967-8:2011 Equivalent

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A newer version of this standard is available.

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US$238.62
Excluding Tax where applicable