IEC 61967-8:2011
Superseded
View Superseded by
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
Hardcopy , PDF
English - French
08-11-2011
05-03-2023
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
10 IC Emissions reference levels
Annex A (normative) - IC stripline description
Annex B (informative) - Specification of emission levels
Bibliography
IEC 61967-8:2011 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
This publication is to be read in conjunction with IEC 61967-1:2002.
| Committee |
TC 47/SC 47A
|
| DevelopmentNote |
To be read in conjunction with IEC 61967-1. (08/2011) Stability Date: 2020 (09/2017)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| NF EN 61967-8 : 2012 | Identical |
| NEN EN IEC 61967-8 : 2011 | Identical |
| I.S. EN 61967-8:2011 | Identical |
| PN EN 61967-8 : 2012 | Identical |
| DIN EN 61967-8 : 2012 | Identical |
| VDE 0847-21-8 : 2012 | Identical |
| BS EN 61967-8:2011 | Identical |
| CEI EN 61967-8 : 2012 | Identical |
| EN 61967-8:2011 | Identical |
| UNE-EN 61967-8:2011 | Identical |
| BS IEC 61225:2019 | Identical |
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