BS IEC 60747-12.1 : 1995
Withdrawn
DISCRETE SEMICONDUCTOR DEVICES AND INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR LIGHT EMITTING/INFRARED EMITTING DIODES WITH/WITHOUT PIGTAIL FOR FIBRE OPTIC SYSTEMS AND SUB-SYSTEMS
Hardcopy , PDF
English
01-01-1995
04-25-2012
Defines a quality assessment procedure that electronic components, released by one participating country, complying with the requirements of a specified application, is equally acceptable in all other participating countries without the need of further tests.
| Committee |
EPL/47/3
|
| DevelopmentNote |
Supersedes 92/04360 DC. Also numbered as BS QC720101(1995). (06/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-12-1:1995 | Identical |
| IEC 60747-12:1991 | Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| BS QC 720100:1991 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
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