IEC 60747-12:1991

FOREWORD
Clause
1 Scope
2 General
  2.1 Related document
  2.2 Recommended values of temperatures (preferred
      values)
  2.3 Recommended values of voltages and currents
      (preferred values)
  2.4 Terminal identification
3 Quality assessment procedures
  3.1 Primary stage of manufacture and subcontracting
  3.2 Structurally similar devices
      3.2.1 Grouping for electrical and optical
            characteristic tests in Groups A and/or B
      3.2.2 Grouping for environmental and mechanical
            tests in Groups B and/or C
      3.2.3 Grouping for endurance tests
  3.3 Inspection requirements for qualification approval
  3.4 Quality conformance inspection
      3.4.1 Division into groups and sub-groups
            Table I - Group A: Lot by lot
            Table II - Group B: Lot by lot
            Table III - Group C: Periodic
  3.5 Group D tests
  3.6 Screening
      Table IV- Screening (under consideration)
  3.7 Sampling requirements
      Table V - Sampling requirements for Group A tests
      Table VI - Sampling requirements for Group B and C
                 tests, in which LTPD shall be used
4 Test and measurement procedures
  4.1 Light emitting diodes, infrared emitting diodes,
      general measurements
  4.2 Photocouplers
  4.3 Laser diodes
  4.4 Photodiodes and phototransistors
  4.5 Other devices (under consideration)
Appendix A - Structural similarity
Appendix B - Dimensions
Appendix C - Directions of applied forces for mechanical
             tests

Gives details of the quality assessment procedures, the inspectionrequirements, screening sequences, sampling requirements, test andmeasurement procedures required for semiconductor optoelectronicdevices. Applies to:-Semiconductor photo-emitters;opto-electronic displays;light-emitting diodes (LED);laser diodes.-Semiconductor photosensitive devices;photodiodes;phototransistors;photothyristors.-Semiconductor imaging devices.-Photocouplers, optocouplers.