BS QC 720104:1997
Withdrawn
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems
Hardcopy , PDF
English
09-15-1997
04-25-2012
INTRODUCTION
4 Limiting values (absolute maximum rating system)
5 Electrical and optical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information
11 Reference documents
Tables
Required information for identification
Limiting values
Electrical and optical characteristics
Group A - Lot-by-lot tests
Group B - Lot-by-lot tests
Group C - Periodic tests
SHOULD BE READ IN CONJUNCTION WITH BS QC700000 AND BS QC720100.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-12-4 Supersedes 95/210321 DC (08/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| IEC 60747-12:1991 | Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60747-5:1992 | Semiconductor devices - Discrete devices and integrated circuits -Part 5: Optoelectronic devices |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.