BS QC 720106:1997
Withdrawn
Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems
Hardcopy , PDF
English
08-15-1997
04-25-2012
INTRODUCTION
4 Limiting values (absolute maximum rating system)
5 Electrical and optical characteristics
6 Marking
7 Ordering information
8 Test conditions and inspection requirements
9 Group D - Qualification approval tests
10 Additional information
11 Reference documents
Tables
Required information for identification
Limiting values
Electrical and optical characteristics
Group A - Lot-by-lot tests
Group B - Lot-by-lot tests
Group C - Periodic tests
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-12-6 Supersedes 95/210321 DC (08/2005)
|
| DocumentType |
Standard
|
| Pages |
18
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| IEC 60747-12:1991 | Semiconductor devices - Part 12: Sectional specification foroptoelectronic devices |
| IEC 60747-10:1991 | Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
| IEC 60747-12-4:1997 | Semiconductor devices - Part 12-4: Optoelectronic devices - Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems |
| BS QC 720100:1991 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices |
| BS QC700000(1991) : 1991 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS |
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