IEC 60747-12-4:1997
Withdrawn
Semiconductor devices - Part 12-4: Optoelectronic devices - Blank detail specification for pin-FET modules with/without pigtail, for fibre optic systems or subsystems
Hardcopy , PDF
English - French
05-09-1997
02-15-2005
Contents
Foreword
Introduction
Clause
4. Limiting values (absolute maximum rating system)
5. Electrical and optical characteristics
6. Marking
7. Ordering information
8. Test conditions and inspection requirements
9. Group D - Qualification approval tests
10. Additional information
11. Reference documents
Tables
Required information for identification
Limiting values
Electrical and optical characteristics
Group A - Lot-by-lot tests
Group B - Lot-by-lot tests
Group C - Periodic tests
| DevelopmentNote |
Also numbered as BS QC720104(1997) (08/2005)
|
| DocumentType |
Standard
|
| Pages |
29
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Withdrawn
|
| Standards | Relationship |
| SAC GB/T 18904.4 : 2002 | Identical |
| NEN IEC 60747-12-4 : 1998 | Identical |
| BS QC 720106:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for avalanche photodiodes (APDs) with/without pigtail, for fibre optic systems or subsystems |
| BS QC 720105:1997 | Harmonized system of quality assessment for electronic components. Semiconductor devices. Optoelectronic devices. Blank detail specification for pin-photodiodes with/without pigtail, for fibre optic systems or subsystems |
| IEC 61747-1:1998+AMD1:2003 CSV | Liquid crystal and solid-state display devices - Part 1: Generic specification |
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