NEN IEC 60747-12-4 : 1998
Withdrawn
Withdrawn
SEMICONDUCTOR DEVICES - PART 12-4: OPTOELECTRONIC DEVICES - BLANK DETAIL SPECIFICATION FOR PIN-FET MODULES WITH/WITHOUT PIGTAIL, FOR FIBRE OPTIC SYSTEMS OR SUBSYSTEMS
Published date
01-12-2013
Publisher
Withdrawn date
04-01-2005
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Describes quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Withdrawn
|
| Standards | Relationship |
| IEC 60747-12-4:1997 | Identical |
Summarise
Sorry this product is not available in your region.