BS IEC 60747-4.1 : 2000
Withdrawn
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 4-1: MICROWAVE DIODES AND TRANSISTORS - MICROWAVE FIELD EFFECT TRANSISTORS - BLANK DETAIL SPECIFICATION
Hardcopy , PDF
English
01-01-2000
04-25-2012
Gives quality assessment procedures in such a manner that electronic components released by one participating country as complying to the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as BS QC750115(2000). Supersedes 90/34420 DC. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-4-1:2000 | Identical |
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