BS ISO 6342:1993
Withdrawn
Micrographics. Aperture cards. Method of measuring thickness of buildup area
Hardcopy , PDF
English
01-15-1994
03-01-2003
NO CONTENTS SECTION
Specifies a method of measuring the thickness of the buildup area on aperture cards for manufacturing and inspection purposes. Coverage includes apparatus, measurement, card thickness, buildup area thickness, and buildup thickness. Also gives diagrams.
| Committee |
IDT/1
|
| DevelopmentNote |
DRAFT FOR COMMENT 89/95842 DC
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Standards | Relationship |
| ISO 6342:2003 | Identical |
| ISO 6342:1993 | Identical |
| ISO 6196-4:1998 | Micrographics — Vocabulary — Part 4: Materials and packaging |
| ISO 6196-1:1993 | Micrographics — Vocabulary — Part 1: General terms |
| ISO 534:2011 | Paper and board — Determination of thickness, density and specific volume |
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