ISO 6342:1993
Withdrawn
View Superseded by
Micrographics — Aperture cards — Method of measuring thickness of buildup area
Hardcopy , PDF
French, English
08-05-1993
11-02-2025
The method specified determines the buildup thickness of the aperture card as the difference between the thickness of the buildup area and the thickness of the card both measured using a micrometer.
| Committee |
ISO/TC 171/SC 2
|
| DocumentType |
Standard
|
| Pages |
3
|
| PublisherName |
International Organization for Standardization
|
| Status |
Withdrawn
|
| SupersededBy |
| Standards | Relationship |
| BS ISO 6342:1993 | Identical |
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