BS QC750115(2000) : 2000
Withdrawn
Withdrawn
SEMICONDUCTOR DEVICES - DISCRETE DEVICES - PART 4-1: MICROWAVE DIODES AND TRANSISTORS - MICROWAVE FIELD EFFECT TRANSISTORS - BLANK DETAIL SPECIFICATION
Published date
11-23-2012
Publisher
Withdrawn date
04-25-2012
Sorry this product is not available in your region.
Gives quality assessment procedures in such a manner that electronic components released by one participating country as complying to the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as BS IEC 60747-4.1. Supersedes 90/34420 DC. (06/2005)
|
| DocumentType |
Standard
|
| PublisherName |
British Standards Institution
|
| Status |
Withdrawn
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-4-1:2000 | Identical |
Summarise
Sorry this product is not available in your region.