CEI 56-35 : 1ED 2000
Superseded
Superseded
View Superseded by
Determination of reliability under stress Part 1: batch repair equipment
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
03-01-2000
Publisher
Superseded date
05-01-2007
Superseded by
Excluding Tax where applicable
Summarise this standard
AI-generated summary
This Standard describes particular methods for optimizing reliability processes under severe conditions for production batches.
| Committee |
CT 56
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC 61163-1:2006 | Identical |
| IEC 61163-1:1995 | Identical |
| IEC 61163-1:1995/COR1:1999 | Identical |