IEC 61163-1:1995
Superseded
View Superseded by
Reliability stress screening - Part 1: Repairable items manufactured in lots
Hardcopy , PDF
08-14-1995
12-31-2021
These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like reliability growth programmes and quality control techniques, are not applicable.
| Committee |
TC 56
|
| DocumentType |
Standard
|
| Pages |
153
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CEI 56-35 : 1ED 2000 | Identical |
| BS 5760-16.1:1996 | Identical |
| UNE 200004-1:2002 | Identical |
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