CEI EN 60749-23/A1 : 2012
Superseded
View Superseded by
Semiconductor devices - Mechanical and climatic test methods Part 23: High temperature operating life
Hardcopy , PDF
English
01-01-2012
04-22-2026
This variant modifies the CEI EN 60749-23: 2006-01 Standard relating to test methods for the evaluation of the useful life in operation at high temperatures for semiconductor devices.
| DocumentType |
Amendment
|
| ISBN |
978-2-88912-334-6
|
| Pages |
0
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Superseded
|
| SupersededBy |
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