CEI EN 60749-23/A1 : 2012
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods Part 23: High temperature operating life
Amendment of
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2012
Publisher
This variant modifies the CEI EN 60749-23: 2006-01 Standard relating to test methods for the evaluation of the useful life in operation at high temperatures for semiconductor devices.
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