CEI EN IEC 60749-23:2026
Current
Current
Semiconductor devices - Mechanical and climatic test methods – Part 23: High temperature operating life
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
03-01-2026
Publisher
US$55.96
Excluding Tax where applicable
This part of IEC 60749 specifies the test used to determine the effects of bias conditions and
temperature on solid state devices over time.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8327-0903-0
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-23:2025 | Identical |
| EN IEC 60749-23:2026 | Identical |
Summarise
US$55.96
Excluding Tax where applicable
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