CEI EN 60749-6:2017-10
Current
Semiconductor devices - Mechanical and climatic test methods Part 6: Storage at high temperature
Hardcopy , PDF
English
10-01-2017
The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| Committee |
CT 309
|
| DocumentType |
Test Method
|
| ISBN |
978-2-8322-4003-8
|
| Pages |
16
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
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