CEI EN 61967-4 : 2009

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
5 Test conditions
6 Test equipment
7 Test set-up
8 Test procedure
9 Test report
Annex A (normative) - Probe calibration procedure
Annex B (informative) - Classification of conducted
        emission levels
Annex C (informative) - Example of reference levels
        for automotive applications
Annex D (informative) - EMC requirements and how
        to use EMC IC measurement techniques
Annex E (informative) - Example of a test set-up
        consisting of an EMC main test board and
        EME IC test board
Annex F (informative) - 150 ohm direct coupling networks
        for common mode emission measurements of
        differential mode data transfer ICs and similar
        circuits
Annex ZA (normative) - Normative references to
         international publications with their corresponding
         European publications

Defines a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network.