CEI EN IEC 63616:2026
Current
Current
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-01-2026
Publisher
US$63.81
Excluding Tax where applicable
This document relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies.
| DocumentType |
Standard
|
| ISBN |
978-2-8327-0894-1
|
| Pages |
20
|
| PublisherName |
Comitato Elettrotecnico Italiano
|
| Status |
Current
|
| Standards | Relationship |
| IEC 63616:2025 | Identical |
| EN IEC 63616:2026 | Identical |
| IEC 61788-7:2020 | Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies |
Summarise
US$63.81
Excluding Tax where applicable
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