IEC 63616:2025
Current
Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method
Hardcopy , PDF
English - French, English, French
11-28-2025
IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
International Electrotechnical Committee
|
| Status |
Current
|
| Standards | Relationship |
| UNE-EN IEC 63616:2026 | Identical |
| CEI EN IEC 63616:2026 | Identical |
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