DD IEC/PAS 62137-3:2008
Superseded
Superseded
View Superseded by
Electronics assembly technology. Selection guidance of environmental and endurance test methods for solder joints
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-31-2009
Publisher
Superseded date
03-31-2012
Superseded by
US$450.07
Excluding Tax where applicable
| Committee |
EPL/501
|
| DocumentType |
Standard
|
| Pages |
0
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
IEC/PAS 62137-3:2008(E) describes the selection of an appropriate test method for reliability test of solder joints for various shapes and types of surface mount devices (SMD) and leaded devices, including various types of solder material.
Summarise
US$450.07
Excluding Tax where applicable