DEFSTAN 00-53/2(1999) : 1999

Name: DEFSTAN 00-53/2(1999) : 1999
Brand: DEFSTAN
Price: 56.21 USD

Superseded

View Superseded by

SAFE OPERATING LIMITS FOR BACKDRIVING

Available format(s)

Hardcopy , PDF

Superseded date

10-31-2007

Language(s)

English

Published date

01-01-1999

Publisher

UK Ministry of Defence Standards

Preface
Section One. General
0 Introduction
1 Scope
2 Further Reading
3 Definitions
Section Two. Guide to In-Circuit Testing
4 Overview
5 Testers
6 Backdriving
7 Danger Mechanisms
Section Three. Backdriving Limits
8 Detailed Requirements
9 Backdriving Condition
10 Pulse Duration
11 General Conditions
12 Bondwire Temperature Rise
Annex A Relationship of Backdriving Current/Pulse Length in Aluminium
        Bondwire in Hollow Packages
Annex B Relationship of Backdriving Current/Pulse Duration in Gold
        Bondwires in Plastic Packages
Annex C Relationship of Backdriving Current/Pulse Duration in Gold
        Bondwires in Hollow Packages
Annex D The Calculation of the Temperature Rise in Bond Wires due to
        Time Varying Currents

Contains requirements for in-circuit testing when used to test electronic components on a panel electronic circuit (PEC), using node forcing techniques such that one or more integrated circuits on PEC under test are subjected to Backdriving.

DevelopmentNote	Supersedes DEFSTAN 00-53/1(1991) (06/2003)
DocumentType	Standard
Pages	24
PublisherName	UK Ministry of Defence Standards
Status	Superseded
SupersededBy	DEFSTAN 00-53/3(2007) : 2007
Supersedes	DEFSTAN 00-53/1(1991) : INTERIM

DEFSTAN 00-13/3(1994) : 1994	REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT
DEFSTAN 00-13(PT2)/1(1978) : 1978	ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT - PART 2: PRODUCTION ACCEPTANCE TESTING
DEFSTAN 00-10/3(1986) : 1986 AMD 2 1993	GENERAL DESIGN AND MANUFACTURING REQUIREMENTS FOR SERVICE ELECTRONIC EQUIPMENT
DEFSTAN 00-13(PT1)/1(1981) : LATEST	REQUIREMENTS FOR THE ACHIEVEMENT OF TESTABILITY IN ELECTRONIC AND ALLIED EQUIPMENT