DEFSTAN 00-53/3(2007) : 2007

Name: DEFSTAN 00-53/3(2007) : 2007
Brand: DEFSTAN
Price: 56.21 USD
Availability: InStock

Withdrawn

SAFE OPERATING LIMITS FOR BACKDRIVING

Available format(s)

Hardcopy , PDF

Withdrawn date

03-08-2017

Language(s)

English

Published date

01-01-2007

Publisher

UK Ministry of Defence Standards

Foreword
Introduction
1 Scope
2 Warning
3 Abbreviations & Definitions
4 Guide to In-Circuit Testing
  4.1 Overview
  4.2 Testers
  4.3 Backdriving
  4.4 Damage Mechanisms
5 Backdriving Limits
  5.1 Detailed Requirements
  5.2 Backdriving Conditions
  5.3 Pulse Duration
  5.4 General Conditions
  5.5 Bondwire Temperature Rise
6 Relationship between Backdriving Current & Pulse Duration
  6.1 Aluminium Bondwires in hollow packages
  6.2 Gold Bondwires in plastic packages
  6.3 Gold Bondwires in hollow packages
7 Calculation of Temperature Rise in Bondwires
  7.1 Heating due to Current
Annex A Definitions and Abbreviations
  A.1 Definitions
  A.2 Abbreviations
  A.3 IC Types and Families
Annex B Bibliography

Provides requirements for in-circuit testing when used to test electronic components on a panel, electronic circuit (PEC), using node forcing techniques such that one or more integrated circuits on the PEC under test are subjected to backdriving.

DevelopmentNote	Supersedes DEFSTAN 00-53/2(1999). (11/2007) This standard is obsolescent because it is no longer required for the procurement of new equipment but is retained for maintenance purposes in support of existing in-service equipment. (01/2012)
DocumentType	Standard
Pages	24
PublisherName	UK Ministry of Defence Standards
Status	Withdrawn
Supersedes	DEFSTAN 00-53/2(1999) : 1999