DIN 50441-1:1996-07
Withdrawn
Withdrawn
TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - DETERMINATION OF THE GEOMETRIC DIMENSIONS OF SEMICONDUCTOR WAFERS - PART 1: THICKNESS AND THICKNESS VARIATION
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-12-2013
Withdrawn date
07-01-2007
Excluding Tax where applicable
| DocumentType |
Standard
|
| Pages |
6
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Withdrawn
|
| DIN 50441-4:1999-03 | TESTING OF MATERIALS FOR SEMICONDUCTOR TECHNOLOGY - DETERMINATION OF THE GEOMETRIC DIMENSIONS OF SEMICONDUCTOR WAFERS - PART 4: SLICE DIAMETER, DIAMETER VARIATION, FLAT DIAMETER, FLAT LENGTH, FLAT DEPTH |
| I.S. EN 50513:2009 | SOLAR WAFERS - DATA SHEET AND PRODUCT INFORMATION FOR CRYSTALLINE SILICON WAFERS FOR SOLAR CELL MANUFACTURING |
| EN 50513:2009 | Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing |
| CEI EN 50513 : 2010 | SOLAR WAFERS - DATA SHEET AND PRODUCT INFORMATION FOR CRYSTALLINE SILICON WAFERS FOR SOLAR CELL MANUFACTURING |
| BS EN 50513:2009 | Solar wafers. Data sheet and product information for crystalline silicon wafers for solar cell manufacturing |
| 08/30176109 DC : DRAFT JAN 2008 | BS EN 50513 - SOLAR WAFERS - DATA SHEET AND PRODUCT INFORMATION FOR CRYSTALLINE SILICON WAFERS FOR SOLAR CELL MANUFACTURING |
| UNE-EN 50513:2011 | Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing |
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