DIN EN 62047-11:2014-04
Current
Current
SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 11: TEST METHOD FOR COEFFICIENTS OF LINEAR THERMAL EXPANSION OF FREE-STANDING MATERIALS FOR MICRO-ELECTROMECHANICAL SYSTEMS (IEC 62047-11:2013)
Available format(s)
Hardcopy , PDF
Language(s)
German
Published date
01-01-2014
US$136.55
Excluding Tax where applicable
| DevelopmentNote |
Supersedes DIN IEC 62047-11. (04/2014)
|
| DocumentType |
Standard
|
| Pages |
21
|
| PublisherName |
German Institute for Standardisation (Deutsches Institut für Normung)
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 62047-11:2013 | Identical |
| IEC 62047-11:2013 | Identical |
Summarise
US$136.55
Excluding Tax where applicable
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.